Click on the Tune Tab in the Master Panel. Set the tune high and low frequency according to the cantilevers being used and the application. For general tapping mode cantilevers: ...

The nanoIR3 from Bruker is an advanced nanoscale IR spectroscopy, property mapping, and chemical imaging system for life science and materials applications. The system offers IR-based chemical imaging ...

The combination of Atomic Force Microscopy (AFM) and Raman spectroscopy provides deep insights into the complex properties of various materials. While Raman spectroscopy facilitates the chemical ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure HORIBA has introduced a new AFM optical ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

The mission of the Scanning Probe Microscopy Core is to provide analytical and high resolution scanning probed based microscopy. This includes Atomic Force Microscopy (AFM) related techniques such as ...

Photothermal AFM-IR, commonly referred to as AFM-IR, is an analytical technique used to understand the chemistry of a material at the nanoscale. It combines the nanoscale spatial resolution of atomic ...

Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...

NanoWorld Pointprobe® Silicon SPM probes are the most widely used and best-known SPM and AFM probe world-wide. They are available in many variations: Various coatings: Aluminum reflex coating, diamond ...