This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...
Wireless devices have become critical tools in everyday life. They allow us to transfer voice, data, images and video with ease. The evolving quest for increasing quantities of data to be transferred ...
The increasing number of power domains found in power management ICs (PMICs) targeted for portable applications places heavy demands on the few precision DC resources found in many ATE systems. Even ...
The industry’s insatiable need for power in high-performance computing (HPC) is creating problems for test cells, which need to deliver very high currents at very consistent voltage levels through the ...
Test equipment manufacturer IFR has moved most of its automatic test equipment (ATE) division into a dedicated European headquarters in Stevenage, and it is already providing the operation with a ...
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