The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a “test re-use” strategy ...
Scandump is an advanced silicon debugging technique that ingeniously repurposes DFT (Design For Testability) scan chains for functional debugging. This method allows for the extraction of states from ...
A technical paper titled “Enhancing Test Efficiency through Automated ATPG-Aware Lightweight Scan Instrumentation” was published by researchers at University of Florida. “Scan-based ...
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