Semiconductor devices are becoming thinner and more complex, making thin deposited films even harder to measure and control. With 3nm node devices in production and 2nm nodes ramping toward ...

Alfred University is recipient of a National Science Foundation (NSF) grant of nearly $350,000, which will be used to acquire equipment that will enhance multi-disciplinary research and education ...

Metrology supplier Nanometrics Inc. today unveiled an integrated metrology tool combining ultraviolet spectroscopic ellipsometry and deep ultraviolet (DUV) spectroscopic reflectometry. In dielectric ...

As well as being an extremely effective standalone tool for thermomicrometric sample analysis, Linkam stages are frequently used to add temperature and environmental control to a variety of ...