Semiconductor Engineering

Using High-Quality Deterministic Patterns For In-System/In-Field Testing

Logic BIST (LBIST) is a well-stablished traditional solution for meeting automotive testing standards. However, using pseudo-random LBIST patterns can be challenging when trying to achieve ...
Semiconductor Engineering

Squeezing Out More Test Compression

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...
UPI

Random gene pulse patterns key to multicellular system development

Feb. 19 (UPI) --New research suggests random gene pulses can produce the patterning necessary for the development of multicellular systems. For even the most complex organisms, life begins as a single ...
Business Wire

Generating Pseudo-Random Speckle Illumination Patterns Allows For High-Resolution Imaging

WASHINGTON--(BUSINESS WIRE)--Using pseudo-random speckle patterns is an efficient way to image targets, but most approaches require bulky, expensive, complex and slow machinery. To apply this ...
Electronic Design

Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d"

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
EDN

Test solutions to confront silent data corruption in ICs

While semiconductor design engineers become more aware of silent data corruption (SDC) or silent data errors (SDE) caused by aging, environmental factors, and other issues, embedded test solutions are ...